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Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering

av Mario Birkholz

With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science…

Materials Characterization

av Yang Leng

Reliability and Risk Assessment

av John J. Andrews
Materials Characterization

Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching adva…

Reliability and Risk Assessment

Risk assessment and risk analysis are now firmly fixed in the engineer's lexicon. Every engineering project, contract, piece of equipment and design requires this discipline by …